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    An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits


    Zhang, Guoyan and Farrell, Ronan (2007) An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits. In: 2006 13th IEEE International Conference on Electronics, Circuits and Systems. IEEE, pp. 612-615. ISBN 1424403944

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    Abstract

    Built-In-Test (BIT) for Radio Frequency Integrated Circuits (RFIC) is an effective method to reduce the testing cost, especially with the increase of integration level and operating frequency. In this work, a fully integrated CMOS BIT methodology is proposed. The BIT circuit used is rectifierbased and gate-source connected MOS transistor with Substrate Positively-Biased (SPB) scheme is used to further improve the detecting sensitivity. With little current consumption, high input impedance and high frequency scalability this circuit can predict complex high frequency performances of RF circuits such as gain, operating frequency, bandwidth and linearity. Besides, the influence of Process, supply Voltage, and Temperature (PVT) variations on the performance of RF circuits can also be monitored by using this BIT circuit.

    Item Type: Book Section
    Additional Information: Copyright © 2005 IEEE. Reprinted from 2006 13th IEEE International Conference on Electronics, Circuits and Systems. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NUI Maynooth ePrints and eTheses Archive's products or services. Internal or personal use of this material is permitted. However, permission for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
    Keywords: Radio Frequency Integrated Circuits; CMOS RF circuits; built-in self test; CMOS integrated circuits; integrated circuit testing; radiofrequency integrated circuits; rectifiers;
    Academic Unit: Faculty of Science and Engineering > Electronic Engineering
    Faculty of Science and Engineering > Research Institutes > Institute of Microelectronics and Wireless Systems
    Item ID: 585
    Identification Number: https://doi.org/10.1109/ICECS.2006.379863
    Depositing User: Dr. Ronan Farrell
    Date Deposited: 04 Jul 2007
    Publisher: IEEE
    Refereed: Yes
    Funders: Enterprise Ireland (EI)
    URI:

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