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    Experimental Model of a Combined Optical Processing System


    Klima, Milos and Dvorak, Pavel and Rott, Jiri and McKenna-Lawlor, Susan and Gleeson, Daniel and Keating, John (1995) Experimental Model of a Combined Optical Processing System. In: Proceedings. Institute of Electrical and Electronics Engineers 29th Annual 1995 International Carnahan Conference on Security Technology, 1995. IEEE, pp. 388-390.

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    Abstract

    The paper describes an experimental model of an optical correlator. Optical information processing systems became a new generation of very high speed processing units because of their natural parallelism and generally fast performance (A. Vanderlugt, 1992). Calculation of the correlation function is one of the most important mathematical tasks in the field of signal and image processing. Special problems such as identification, detection of weak signals below noise level etc. are frequently solved by using correlation units. The most important part of an optical processing system is a spatial modulator. A spatial modulator-a converter of an electrical signal into an optical image-can be based upon many physical principles. From them we have tested a combined setup consisting of an 18 line LCD modulator as a computer controlled reference and an acoustooptic unit as a signal modulator. The model has been used for a real time identification of codewords up to 18 bits long in a signal flow. Finally, some parameters of the experimental system model are summarized and future expectations of improvement are outlined.

    Item Type: Book Section
    Keywords: combined optical processing correlation system; optical correlator; optical information processing systems; natural parallelism, correlation function; image processing; optical image; LCD modulator;
    Academic Unit: Faculty of Science and Engineering > Computer Science
    Item ID: 8679
    Identification Number: https://doi.org/10.1109/CCST.1995.524940
    Depositing User: Dr. John Keating
    Date Deposited: 24 Aug 2017 14:44
    Publisher: IEEE
    Refereed: Yes
    URI:

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