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    Subblocks interleaving PTS technique with minimum processing time for PAPR reduction in OFDM systems


    Al-Hussaini, Khalid and Ali, Borhanuddin Mohd and Varahram, Pooria and Hashim, Shaiful Jahari Bin and Farrell, Ronan (2016) Subblocks interleaving PTS technique with minimum processing time for PAPR reduction in OFDM systems. Journal of Engineering, 5 (5). pp. 134-140. ISSN 2051-3305

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    Abstract

    This study presents subblocks interleaving partial transmit sequence (SBI-PTS) technique having low complexity for reducing the peak-to-average power ratio in orthogonal frequency division multiplexing systems. In this technique, a new subblocks interleaver is proposed, in which each subblock is interleaved with the others. Moreover, a new optimisation scheme is introduced, in which the number of iterations is made to be equal to the number of subblocks only which results in reduced processing time and less computation that leads to reduced complexity. Simulation results demonstrate that the new technique can effectively reduce the complexity by up to 99.95% (for subblocks number M = 16, inverse fast Fourier transform size N = 256) compared with the conventional PTS and new existing PTS techniques and yield good bit error rate performance. The other salient feature of this scheme is that it does not require side information and thus it offers increased transmission efficiency.

    Item Type: Article
    Additional Information: This is an open access article published by the IET under the Creative Commons Attribution-NonCommercial-NoDerivs License http://creativecommons.org/licenses/by-nc-nd/3.0/)
    Keywords: OFDM modulation; fast Fourier transforms; error statistics; iterative methods; inverse transforms;
    Academic Unit: Faculty of Arts,Celtic Studies and Philosophy > Language Centre
    Item ID: 10297
    Identification Number: https://doi.org/10.1049/joe.2016.0074
    Depositing User: Dr. Ronan Farrell
    Date Deposited: 10 Dec 2018 14:33
    Journal or Publication Title: Journal of Engineering
    Publisher: IET
    Refereed: Yes
    URI:

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