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    Effect of additive noise on phase measurement in digital holographic microscopy


    Pandey, Nitesh and Hennelly, Bryan M. (2011) Effect of additive noise on phase measurement in digital holographic microscopy. 3D Research, 2 (1). p. 6. ISSN 2092-6731

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    Abstract

    Digital holographic microscopy is a quantitative phase measurement technique that can provide nanometer resolution of the thickness or surface profile of an object. We analyze the influence of additive noise in the hologram plane on the accuracy of phase measurement. We analyze Gaussian distributed and Poisson distributed shot noise in the camera plane and we develop a model for quantifying the phase error in the reconstructed phase.

    Item Type: Article
    Keywords: Noise; Phase Measurement; Digital Holographic Microscopy;
    Academic Unit: Faculty of Science and Engineering > Computer Science
    Faculty of Science and Engineering > Electronic Engineering
    Faculty of Science and Engineering > Research Institutes > Hamilton Institute
    Item ID: 8714
    Identification Number: https://doi.org/10.1007/01(2011)6
    Depositing User: Dr. Bryan Hennelly
    Date Deposited: 04 Sep 2017 11:27
    Journal or Publication Title: 3D Research
    Publisher: Springer
    Refereed: Yes
    Funders: European community's seventh framework programme FP7/2007-2013, Science Foundation Ireland
    URI:

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