Wilson, Simon and Flood, Ben and Goyal, Suresh and Masher, Jim and Bergin, Susan and O'Brien, Joseph and Kennedy, Robert (2007) Parameter Estimation for a Model With Both Imperfect Test and Repair. VLSI Test Symposium, 2007, 25th IEEE. pp. 271-276. ISSN 1093-0167

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Abstract

We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.

Item Type:	Article
Keywords:	Repair network; binary result; popular mean; Gaussian model; Bayesian inference techniques;
Academic Unit:	Faculty of Science and Engineering > Computer Science
Item ID:	2309
Depositing User:	Dr. Susan Bergin
Date Deposited:	14 Dec 2010 10:54
Journal or Publication Title:	VLSI Test Symposium, 2007, 25th IEEE
Publisher:	IEEE VlSI Test Symposium
Refereed:	Yes
URI:
Use Licence:	This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

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