O'Neill, R.W. and Greenwood, J.B. and Gradziel, Marcin and Williams, I.D. (2001) Microcontroller based double beam modulation system for atomic scattering experiments. Measurement Science and Technology, 12 (9). pp. 1480-1485. ISSN 0957-0233

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Abstract

Double beam modulation is widely used in atomic collision experiments in the case where the noise arising from each of the beams exceeds the measured signal. A method for minimizing the statistical uncertainty in a measured signal in a given time period is discussed, and a flexible modulation and counting system based on a low cost PIC microcontroller is described. This device is capable of modifying the acquisition parameters in real time during the course of an experimental run. It is shown that typical savings in data acquisition time of approximately 30% can be achieved using this optimized modulation scheme.

Item Type:	Article
Additional Information:	The definitive version of this article is available at doi:10.1088/0957-0233/12/9/314
Keywords:	electron–ion; beam modulation; microcontroller; statistical optimization;
Academic Unit:	Faculty of Science and Engineering > Experimental Physics
Item ID:	4440
Depositing User:	Dr. Raymond O'Neill
Date Deposited:	27 Aug 2013 16:12
Journal or Publication Title:	Measurement Science and Technology
Publisher:	IOP Publishing Ltd.
Refereed:	Yes
URI:	http://iopscience.iop.org/0957-0233
Use Licence:	This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

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