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O'Neill, R.W., Greenwood, J.B., Gradziel, Marcin and Williams, I.D. (2001) Microcontroller based double beam modulation system for atomic scattering experiments. Measurement Science and Technology, 12 (9). pp. 1480-1485. ISSN 0957-0233
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Abstract
Double beam modulation is widely used in atomic collision experiments in
the case where the noise arising from each of the beams exceeds the
measured signal. A method for minimizing the statistical uncertainty in a
measured signal in a given time period is discussed, and a flexible
modulation and counting system based on a low cost PIC microcontroller is
described. This device is capable of modifying the acquisition parameters in
real time during the course of an experimental run. It is shown that typical
savings in data acquisition time of approximately 30% can be achieved
using this optimized modulation scheme.
| Item Type: | Article |
|---|---|
| Additional Information: | The definitive version of this article is available at doi:10.1088/0957-0233/12/9/314 |
| Keywords: | electron–ion; beam modulation; microcontroller; statistical optimization; |
| Academic Unit: | Faculty of Science and Engineering > Experimental Physics |
| Item ID: | 4440 |
| Depositing User: | Dr. Raymond O'Neill |
| Date Deposited: | 27 Aug 2013 16:12 |
| Journal or Publication Title: | Measurement Science and Technology |
| Publisher: | IOP Publishing Ltd. |
| Refereed: | Yes |
| Related URLs: | |
| URI: | https://mural.maynoothuniversity.ie/id/eprint/4440 |
| Use Licence: | This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here |
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