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Wilson, Simon, Flood, Ben, Goyal, Suresh, Masher, Jim, Bergin, Susan, O'Brien, Joseph and Kennedy, Robert (2007) Parameter Estimation for a Model With Both Imperfect Test and Repair. VLSI Test Symposium, 2007, 25th IEEE. pp. 271-276. ISSN 1093-0167
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Official URL: http://doi.ieeecomputersociety.org/10.1109/VTS.200...
Abstract
We describe estimation of the parameters of a
manufacturing test and repair model using data available
from that test. The model allows imperfect testing and
imperfect repair. The principal problem that we address
is of parameter identification, given insufficient data, that we address by making conservative assumptions on the
property being measured and the associated parameter
values. Several cases of commonly occurring test types, in
the manufacture of electronic products, are considered.
| Item Type: | Article |
|---|---|
| Keywords: | Repair network; binary result; popular mean; Gaussian model; Bayesian inference techniques; |
| Academic Unit: | Faculty of Science and Engineering > Computer Science |
| Item ID: | 2309 |
| Depositing User: | Dr. Susan Bergin |
| Date Deposited: | 14 Dec 2010 10:54 |
| Journal or Publication Title: | VLSI Test Symposium, 2007, 25th IEEE |
| Publisher: | IEEE VlSI Test Symposium |
| Refereed: | Yes |
| URI: | https://mural.maynoothuniversity.ie/id/eprint/2309 |
| Use Licence: | This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here |
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