MURAL - Maynooth University Research Archive Library



    Items where Author is "Burke, K."


    Up a level
    Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
    Group by: Item Type | Date | No Grouping
    Jump to: Book Section
    Number of items: 2.

    Book Section

    Burke, K. and Power, J.A. and Donnellan, Brian and Moloney, K. and Lane, W.A. (1994) Worst-case MOSFET parameter extraction for a 2 /spl mu/m CMOS process. In: Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures. IEEE, pp. 119-125. ISBN 0780317572

    Burke, K. and Power, J.A. and Donnellan, Brian and Moloney, K. and Lane, W.A. (1994) Worst-case MOSFET parameter extraction for a 2μm CMOS process. In: Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures. IEEE, pp. 119-125. ISBN 0780317572

    This list was generated on Tue Nov 26 22:22:06 2024 UTC.
    MURAL - Maynooth University Research Archive Library is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.