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    Items where Author is "Kennedy, Robert"


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    Wilson, Simon and Flood, Ben and Goyal, Suresh and Masher, Jim and Bergin, Susan and O'Brien, Joseph and Kennedy, Robert (2007) Parameter Estimation for a Model With Both Imperfect Test and Repair. VLSI Test Symposium, 2007, 25th IEEE. pp. 271-276. ISSN 1093-0167

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