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Ragnoli, Emanuele and McLoone, Seamus and Ringwood, John and Macgerailt, N. (2008) Matrix Factorisation Techniques for Endpoint Detection in Plasma Etching. In: IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE, pp. 156-161. ISBN 9781424419647
Ma, Beibei and McLoone, Sean F. and Ringwood, John and Macgerailt, N. (2008) Selecting signature optical emission spectroscopy variables using sparse principal component analysis. In: 11th International Conference on Computer and Information Technology, 2008. ICCIT 2008. 10.1109/ICCITECHN.2008.4803104 . IEEE, pp. 14-19. ISBN 9781424421350
