MURAL - Maynooth University Research Archive Library



    Items where Author is "Moloney, K."


    [up] Up a level
    Group by: Item Type | Date | No Grouping
    Number of items: 2.

    Burke, K., Power, J.A., Donnellan, Brian, Moloney, K. and Lane, W.A. (1994) Worst-case MOSFET parameter extraction for a 2 /spl mu/m CMOS process. In: Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures. IEEE, pp. 119-125. ISBN 0780317572

    Burke, K., Power, J.A., Donnellan, Brian, Moloney, K. and Lane, W.A. (1994) Worst-case MOSFET parameter extraction for a 2μm CMOS process. In: Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures. IEEE, pp. 119-125. ISBN 0780317572

    This list was generated on Mon Dec 23 01:27:09 2024 UTC.
    MURAL - Maynooth University Research Archive Library is powered by EPrints 3.4 which is developed by the School of Electronics and Computer Science at the University of Southampton. About EPrints | Accessibility