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    Items where Author is "Prakash, PKS"


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    Conference or Workshop Item

    Prakash, PKS and McLoone, Sean F. (2011) Plasma Etch Process Virtual Metrology using Aggregative Linear Regression. In: Third International Conference of Soft Computing and Pattern Recognition (SocPaR 2011), 14-16 October 2011, Dalian, China.

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