MURAL - Maynooth University Research Archive Library



    Items where Author is "Ward, Eamon"


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    Conference or Workshop Item

    Farrell, Ronan, Ward, Eamon and Brady, Pat (2008) Detection of Coupling Effects in Nanoscale Digital Logic. In: Intel European Research and Innovation Conference , 10-12 September 2008 , Leixlip, Ireland .

    Srinivasan, Prakash, Farrell, Ronan and Ward, Eamon (2008) Modular Scan Test for SoC Design. In: Intel European Research and Innovation Conference, 10-12 September 2008 , Leixlip, Ireland .

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