Pitkäaho, Tomi and Manninen, Aki and Naughton, Thomas J. (2017) Deep convolutional neural networks and digital holographic microscopy for in-focus depth estimation of microscopic objects. In: Irish Machine Vision and Image Processing Conference Proceedings 2017. Irish Pattern Recognition & Classification Society, pp. 52-59. ISBN 978-0-9934207-2-6

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Abstract

Deep artificial neural network learning is an emerging tool in image analysis. We demonstrate its poten- tial in the field of digital holographic microscopy by addressing the challenging problem of determining the in-focus reconstruction depth of an arbitrary epithelial cell cluster encoded in a digital hologram. A deep convolutional neural network learns the in-focus depths from half a million hologram amplitude images. The trained network correctly determines the in-focus depth of new holograms with high probability, with- out performing numerical propagation. To our knowledge, this is the first application of deep learning in the field of digital holographic microscopy.

Item Type:	Book Section
Additional Information:	This paper was presented at the 19th Irish Machine Vision and Image Processing conference (IMVIP 2017) Aug 30th-Sept 1st, 2017, Maynooth, Ireland.
Keywords:	Imaging; Digital Holographic Microscopy; Autofocusing; Deep Learning; Machine Learning;
Academic Unit:	Faculty of Science and Engineering > Computer Science Faculty of Science and Engineering > Research Institutes > Hamilton Institute
Item ID:	12049
Depositing User:	Thomas Naughton
Date Deposited:	18 Dec 2019 16:16
Publisher:	Irish Pattern Recognition & Classification Society
Refereed:	Yes
URI:	Organisation Organisation Publisher
Use Licence:	This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

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