Ostrovskii, Valerii Y. and Nazare, Thalita E. and Martins, Samir A. M. and Nepomuceno, Erivelton (2020) Temperature as a Chaotic Circuit Bifurcation Parameter. In: 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus). IEEE, pp. 154-157. ISBN 978-1-7281-5761-0

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Abstract

The number of researches aimed at understanding the chaotic behavior of nonlinear dynamical systems has grown considerably in recent years. The development of electronic circuits that exhibit this type of behavior has been the interest of numerous works in the literature. Among the possible sets of nonlinear systems, the simplest in which one can observe bifurcation phenomena and chaotic behavior, followed by well– controlled experiments, are nonlinear electronic circuits. One of the most widely used tools for analysis and evaluation of chaotic behavior is known as the bifurcation diagram. Generally, in the analysis of these circuits, parameters such as voltage, current and frequency are used to verify their respective behaviors. Variable values of passive components such as resistors and capacitors are also widely used. The temperature has also been used as a bifurcation parameter in resistor, diode and inductor (RLD) circuits. However, there is little attention from the scientific community on temperature as a bifurcation parameter for electronic circuits using operational amplifiers such as the chaotic Jerk circuit. In this sense, this project aims to implement a chaotic Jerk circuit, composed of operational amplifiers, resistors and capacitors, and subject it to different temperature levels, using this variable as an analysis parameter. Thus, at the end of this work it was possible to verify that the temperature variation directly influences the behavior of the investigated system, thus reaching the final objective of the project, presenting that the temperature can be a bifurcation parameter for a chaotic Jerk circuit.

Item Type:	Book Section
Keywords:	chaotic circuit; chaos; jerk dynamics; bifurcation; temperature;
Academic Unit:	Faculty of Science and Engineering > Electronic Engineering Faculty of Science and Engineering > Research Institutes > Hamilton Institute
Item ID:	16856
Identification Number:	https://doi.org/10.1109/EIConRus49466.2020.9038964
Depositing User:	Erivelton Nepomuceno
Date Deposited:	16 Jan 2023 16:29
Publisher:	IEEE
Refereed:	Yes
URI:	Publisher
Use Licence:	This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

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