MURAL - Maynooth University Research Archive Library

    Parameter Estimation for a Model With Both Imperfect Test and Repair

    Wilson, Simon and Flood, Ben and Goyal, Suresh and Masher, Jim and Bergin, Susan and O'Brien, Joseph and Kennedy, Robert (2007) Parameter Estimation for a Model With Both Imperfect Test and Repair. VLSI Test Symposium, 2007, 25th IEEE. pp. 271-276. ISSN 1093-0167

    [img] Download (249kB)
    Official URL:

    Share your research

    Twitter Facebook LinkedIn GooglePlus Email more...

    Add this article to your Mendeley library


    We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.

    Item Type: Article
    Keywords: Repair network; binary result; popular mean; Gaussian model; Bayesian inference techniques;
    Academic Unit: Faculty of Science and Engineering > Computer Science
    Item ID: 2309
    Depositing User: Dr. Susan Bergin
    Date Deposited: 14 Dec 2010 10:54
    Journal or Publication Title: VLSI Test Symposium, 2007, 25th IEEE
    Publisher: IEEE VlSI Test Symposium
    Refereed: Yes
      Use Licence: This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

      Repository Staff Only(login required)

      View Item Item control page


      Downloads per month over past year

      Origin of downloads