MURAL - Maynooth University Research Archive Library

    Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits

    Zhang, Guoyan and Farrell, Ronan (2006) Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. In: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems. IEEE, pp. 87-88. ISBN 1424401852

    [img] Download (391kB)

    Share your research

    Twitter Facebook LinkedIn GooglePlus Email more...

    Add this article to your Mendeley library


    An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the conversion efficiency and the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn't consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier by using this BIT detecting circuit has been verified, and gain and linearity information can be obtained without influencing the performance of the attached RF circuits.

    Item Type: Book Section
    Additional Information: Copyright © 2005 IEEE.  Reprinted from 2006 IEEE Design and Diagnostics of Electronic Circuits and systems. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NUI Maynooth ePrints and eTheses Archive's products or services.  Internal or personal use of this material is permitted.  However, permission for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
    Keywords: BIT; Rectifier-based; RF; built-in self test; integrated circuit testing; low-power electronics; MOS integrated circuits; radiofrequency integrated circuits; rectifying circuits;
    Academic Unit: Faculty of Science and Engineering > Electronic Engineering
    Faculty of Science and Engineering > Research Institutes > Institute of Microelectronics and Wireless Systems
    Item ID: 586
    Identification Number:
    Depositing User: Ronan Farrell
    Date Deposited: 04 Jul 2007
    Publisher: IEEE
    Refereed: Yes
    Funders: Enterprise Ireland (EI)
    Use Licence: This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

    Repository Staff Only(login required)

    View Item Item control page


    Downloads per month over past year

    Origin of downloads