Pandey, Nitesh and Hennelly, Bryan M. (2011) Effect of additive noise on phase measurement in digital holographic microscopy. 3D Research, 2 (1). p. 6. ISSN 2092-6731

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Abstract

Digital holographic microscopy is a quantitative phase measurement technique that can provide nanometer resolution of the thickness or surface profile of an object. We analyze the influence of additive noise in the hologram plane on the accuracy of phase measurement. We analyze Gaussian distributed and Poisson distributed shot noise in the camera plane and we develop a model for quantifying the phase error in the reconstructed phase.

Item Type:	Article
Keywords:	Noise; Phase Measurement; Digital Holographic Microscopy;
Academic Unit:	Faculty of Science and Engineering > Computer Science Faculty of Science and Engineering > Electronic Engineering Faculty of Science and Engineering > Research Institutes > Hamilton Institute
Item ID:	8714
Identification Number:	https://doi.org/10.1007/01(2011)6
Depositing User:	Dr. Bryan Hennelly
Date Deposited:	04 Sep 2017 11:27
Journal or Publication Title:	3D Research
Publisher:	Springer
Refereed:	Yes
Funders:	European community's seventh framework programme FP7/2007-2013, Science Foundation Ireland
URI:	http://www.springer.com/
Use Licence:	This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here

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