MURAL - Maynooth University Research Archive Library



    Items where Author is "Srinivasan, Prakash"


    Group by: Item Type | Date | No Grouping
    Number of items: 2.

    Book Section

    Srinivasan, Prakash and Farrell, Ronan (2010) Hierarchical DFT with Combinational Scan Compression, Partition Chain and RPCT. In: IEEE Computer Society Annual Symposium on VLSI, 2010. IEEE, pp. 52-57. ISBN 9781424473212

    Conference or Workshop Item

    Srinivasan, Prakash, Farrell, Ronan and Ward, Eamon (2008) Modular Scan Test for SoC Design. In: Intel European Research and Innovation Conference, 10-12 September 2008 , Leixlip, Ireland .

    This list was generated on Mon Dec 23 01:26:51 2024 UTC.