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Zhang, Guoyan and Farrell, Ronan (2007) An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits. In: 2006 13th IEEE International Conference on Electronics, Circuits and Systems. IEEE, pp. 612-615. ISBN 1424403944

Zhang, Guoyan, Sánchez Mora, Magdalena and Farrell, Ronan (2006) A Built-In-Test Circuit for Functional Verification & PVT Variations Monitoring of CMOS RF Circuits. In: UNSPECIFIED.

Zhang, Guoyan and Farrell, Ronan (2006) Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. In: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems. IEEE, pp. 87-88. ISBN 1424401852