Book Section

Zhang, Guoyan and Farrell, Ronan (2007) An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits. In: 2006 13th IEEE International Conference on Electronics, Circuits and Systems. IEEE, pp. 612-615. ISBN 1424403944

Zhang, Guoyan and Farrell, Ronan (2006) Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. In: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems. IEEE, pp. 87-88. ISBN 1424401852

Conference or Workshop Item

Hung, Peter, McLoone, Sean F., Sanchez, Magdalena, Farrell, Ronan and Zhang, Guoyan (2007) Direct and Indirect Classification of High-Frequency LNA Performance using Machine Learning Techniques. In: ICINCO 2007, International Conference on Information in Control, Automation and Robotics.

Zhang, Guoyan, Sánchez Mora, Magdalena and Farrell, Ronan (2006) A Built-In-Test Circuit for Functional Verification & PVT Variations Monitoring of CMOS RF Circuits. In: UNSPECIFIED.